English 简体中文
    Patent Technology
Partners
Company Profile

BestronST Co., LTD is an advanced scientific instrument manufacturer with independent intellectual property rights.BestronST is committed to transforming innovative, prospective technological achievements of strategic value to provide our customers with cutting-edge scientific solutions, especially in the field of electron microscopy. These solutions aim to address key issues and are believed to bring about advancement in fields including materials science, physics, energy, biology, etc.In line with the principle of mutual benefit and resource sharing, we look forward to communicating in-depth...

MORE



Patent Technology

  • Patent type:Chinese patent Patent name:The utility model relates to an in-situ experimental platform loaded by tem force and thermal coupling field
    Patent type:Chinese patent
    Patent name:    The utility model relates to an in-situ experimental platform loaded by tem force and thermal coupling field


  • Patent type:Chinese patent Patent name:In situ force and electrical properties of biaxial tilting were used to test the sample rod by tem in 2013
    Patent type:Chinese patent
    Patent name:    In situ force and electrical properties of biaxial tilting were used to test the sample rod by tem in 2013
  • Patent type:Japanese patent Patent name:Transmission electron microscope (tem) test sample rod with biaxial tilting in situ force and electrical properties
    Patent type:Japanese patent
    Patent name:    Transmission electron microscope (tem) test sample rod with biaxial tilting in situ force and electrical properties
  • Patent type:American patent Patent name:Transmission electron microscope biaxial tilting in-situ mechanical sample rod -1 based on piezoelectric ceramic drive
    Patent type:American patent
    Patent name:    Transmission electron microscope biaxial tilting in-situ mechanical sample rod -1 based on piezoelectric ceramic drive
  • Patent type:Chinese patent Patent name:A transmission electron microscope USES a biaxial tilting sample table
    Patent type:Chinese patent
    Patent name:    A transmission electron microscope USES a biaxial tilting sample table
  • Patent type:Chinese patent Patent name:Transmission electron microscope biaxial tilting in situ mechanical sample rod driven by piezoelectric ceramics
    Patent type:Chinese patent
    Patent name:    Transmission electron microscope biaxial tilting in situ mechanical sample rod driven by piezoelectric ceramics
  • Patent type:Chinese patent Patent name:The invention relates to a transmission electron microscope double dip in situ nano indentation platform
    Patent type:Chinese patent
    Patent name:    The invention relates to a transmission electron microscope double dip in situ nano indentation platform
  • Patent type:American patent Patent name:Transmission electron microscope (tem) test sample rod with biaxial tilting in situ force and electrical properties
    Patent type:American patent
    Patent name:    Transmission electron microscope (tem) test sample rod with biaxial tilting in situ force and electrical properties
  • Patent type:Chinese patent Patent name:An in-situ TEM tensile table for studying mechanical properties of a material at a specific temperature
    Patent type:Chinese patent
    Patent name:An in-situ TEM tensile table for studying mechanical properties of a material at a specific temperature

MORE



Partners

Changchun Institute of Optics,Fine Mechanics and Phusics(CIOMP)
Institute of Physics CAS
Thermo Fisher Scientific
Shanghai Jiaotong University
Beijing university of technology
Zhejiang University
MORE

Follow us

BestronST (Beijing) Science and Technology Co., LTD.

Add:  

Beijing University of Technology Science park, Building 29, Yard 1, Jinghai Fifth Road, Tongzhou District, Beijing 

Mobile：

+86-010-67866979

E-mail：

info@bestronst.com