An in-situ TEM tensile table for studying mechanical properties of a material at a specific temperature
In situ force and electrical properties of biaxial tilting were used to test the sample rod by tem in 2013
Transmission electron microscope (tem) test sample rod with biaxial tilting in situ force and electrical properties
The utility model relates to an in-situ experimental platform loaded by tem force and thermal coupling field
The invention relates to a transmission electron microscope double dip in situ nano indentation platform
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